In: Physical Review A: atomic, molecular and optical physics, 2011, vol. 83, no. 2, p. 022708
The electron-induced L₃M two-step double ionization cross sections of metallic Pd were determined experimentally for incident electron beam energies ranging from the double ionization threshold up to 18 keV. The double L₃M ionization cross sections were derived from the intensity ratios (ILαM:ILα) of the resolved M satellites to the parent diagram lines. The sample was...
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In: Physical Review A, 2010, vol. 91, no. 06, p. 064702
An observation of the internal structure of the L-shell hypersatellite x rays resulting from the one-photon decay of L⁻² double-vacancy states in palladium multiply ionized by oxygen ions is reported. The Pd L₃→M4,5 x-ray spectrum was measured with a von Hamos high-resolution crystal spectrometer. The complex shape of the observed spectrum could be interpreted in detail using...
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In: Journal of Physics: Conference Series, 2010, vol. 212, no. 1, p. 012006
The photon energy dependence of the double K-shell ionization of light atoms is reported. Experimental double-to-single photoionization cross section ratios for Mg, Al, Si and Ca were obtained from measurements of high-resolution x-ray emission spectra. The double photoionization (DPI) cross-sections for K-shell hollow atom production are compared to convergent close-coupling calculations (CCC)...
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In: Spectrochimica Acta Part B: Atomic Spectroscopy, 2010, p. -
The synchrotron radiation based high-resolution grazing emission X-ray fluorescence (GEXRF) technique was used to extract the distribution of Al ions implanted with a dose of 10¹⁶ atoms/cm² in Si wafers with energies ranging between 1 and 100 keV. The depth distributions of the implanted ions were deduced from the measured angular profiles of the Al-Kα X-ray fluorescence line with...
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In: Review of Scientific Instruments, 2008, vol. 79, no. 2, p. 083101
Using 98% linearly polarized radiation at the European Synchrotron Radiation Facility in Grenoble, the performance of a prototype two-dimensional microstrip Ge(i) detector for x-ray imaging and as a Compton polarimeter has been evaluated. Using the energy and position sensitivity of the detector, the ability to obtain a complete reconstruction of the Compton event has been demonstrated. The...
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In: Journal of Applied Physics, 2009, vol. 105, p. 086101
We report on the application of synchrotron radiation based high-resolution grazing-emission x-ray fluorescence (GEXRF) method to measure low-level impurities on silicon wafers. The presented high-resolution GEXRF technique leads to direct detection limits of about 10¹² atoms/cm². The latter can be presumably further improved down to 10⁷ atoms/cm² by combining the synchrotron...
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In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2007, vol. 260, no. 2, p. 642-646
In this work our previous study about chemical effects in the Kα spectra of S compounds employing high-resolution X-ray spectroscopy has been extended to the Kβ emission spectra. The measurements were performed with a wavelength dispersive single crystal spectrometer operated in the von Hamos geometry having an energy resolution comparable to the natural linewidth of the measured Kβ X-ray...
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In: Physical Review A, 2007, vol. 75, no. 2, p. 022512
X-ray resonant Raman scattering (RRS) spectra of Al, Al₂O₃, Si, and SiO₂ were measured at the European Synchrotron Radiation Facility, using a high-resolution Bragg-type curved crystal spectrometer. The x-ray RRS spectra were collected at several beam energies tuned below the 1s absorption thresholds of Al and Si. Differences in the spectral features between the elemental samples and...
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In: Nuclear Instruments and Methods in Physics Research B: Beam Interactions with Materials and Atoms, 2005, vol. 233(1-4), p. 235-239
The double 1s ionization of Si induced in collisions with protons and heavier ions (C, Ne) was studied by measuring the K X-ray emission of a solid Si target. In order to resolve the hypersatellite contributions in the spectra, high-resolution crystal diffractometry was employed yielding subelectronvolt energy resolution. Experimentally obtained hypersatellite yields were used to determine the...
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In: Physical Review A, 2004, vol. 70, p. 062720-62730
The satellite and hypersatellite K x-ray emission of a thin Mg foil and thick polycrystalline Si target bombarded by 34-MeV C and 50-MeV Ne ions was measured using high-resolution crystal diffractometry. The corresponding projectile reduced velocities v/vK were 1.09 and 0.92 for C ions and 1.02, 0.86 for Ne ions in case of Mg and Si targets, respectively. An energy resolution of approximately 0.5...
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