Université de Neuchâtel

High Resolution Interference Microscopy: A Tool for Probing Optical Waves in the Far-Field on a Nanometric Length Scale

Rockstuhl, Carsten ; Märki, Iwan ; Scharf, Toralf ; Salt, Martin Guy ; Herzig, Hans-Peter ; Dändliker, René

In: Current Nanoscience, 2006, vol. 2, no. 4, p. 337-350

High Resolution Interference Microscopy (HRIM) is a technique that allows the characterization of amplitude and phase of electromagnetic wave-fields in the far-field with a spatial accuracy that corresponds to a few nanometers in the object plane. Emphasis is put on the precise determination of topological features in the wave-field, called phase singularities or vortices, which are spatial...