Faculté des sciences

Relation between substrate surface morphology and microcrystalline silicon solar cell performance

Python, Martin ; Vallat-Sauvain, Evelyne ; Bailat, Julien ; Dominé, Didier ; Fesquet, Luc ; Shah, Arvind ; Ballif, Christophe

In: Journal of Non-Crystalline Solids, 2008, vol. 354, p. 19-25

In the present paper, the structural and electrical performances of microcrystalline silicon (μc-Si:H) single junction solar cells co-deposited on a series of substrates having different surface morphologies varying from V-shaped to U-shaped valleys, are analyzed. Transmission electron microscopy (TEM) is used to quantify the density of cracks within the cells deposited on the various... Plus

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    Summary
    In the present paper, the structural and electrical performances of microcrystalline silicon (μc-Si:H) single junction solar cells co-deposited on a series of substrates having different surface morphologies varying from V-shaped to U-shaped valleys, are analyzed. Transmission electron microscopy (TEM) is used to quantify the density of cracks within the cells deposited on the various substrates. Standard 1 sun, variable illumination measurements (VIM) and Dark J(V) measurements are performed to evaluate the electrical performances of the devices. A marked increase of the reverse saturation current density (J0) is observed for increasing crack densities. By introducing a novel equivalent circuit taking into account such cracks as non-linear shunts, the authors are able to relate the magnitude of the decrease of Voc and FF to the increasing density of cracks.