Faculté des sciences

Growth of thin Bi films on W(1 1 0)

Koitzsch, Christian ; Bovet, M. ; Clerc, Florian ; Naumovic, D. ; Schlapbach, Louis ; Aebi, Philipp

In: Surface Science, 2003, vol. 527, no. 1-3, p. 51-56

We report on the growth of single crystalline epitaxial Bi films on W(1 1 0). X-ray photoelectron diffraction (XPD) and low energy electron diffraction (LEED) reveal that Bi grows well ordered in the pseudocubic (0 0 1) orientation. The two-fold symmetric W(1 1 0) surface supports four different Bi(0 0 1) domains. The multi-domain nature is unambigously detected via LEED showing a peculiar... Plus

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    Summary
    We report on the growth of single crystalline epitaxial Bi films on W(1 1 0). X-ray photoelectron diffraction (XPD) and low energy electron diffraction (LEED) reveal that Bi grows well ordered in the pseudocubic (0 0 1) orientation. The two-fold symmetric W(1 1 0) surface supports four different Bi(0 0 1) domains. The multi-domain nature is unambigously detected via LEED showing a peculiar splitting of spots. It is shown that a preferential domain alignment along the [0 0 1]tungsten-direction accounts for this observation and is in agreement with a two-fold XPD pattern.