Faculté des sciences

Angle-scanned photoemission: Fermi surface mapping and structural determination

Aebi, Philipp ; Fasel, Roman ; Naumovic, D. ; Hayoz, J. ; Pillo, Th. ; Bovet, M ; Agostino, R. G. ; Patthey, L. ; Schlapbach, Louis ; Gil, F. P. ; Berger, Helmuth ; Kreutz, T. J. ; Osterwalder, Jürg

In: Surface Science, 1998, vol. 402-404, p. 614-622

A brief survey of the angle-scanned photoemission technique is given. It incorporates two complementary methods in one: 1. Mapping of X-ray excited photoelectron intensities over virtually the complete hemisphere above the sample surface results in extended data sets where important surface-geometrical structure information is extracted and even “fingerprinting” is possible. This... Plus

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    Summary
    A brief survey of the angle-scanned photoemission technique is given. It incorporates two complementary methods in one:

    1. Mapping of X-ray excited photoelectron intensities over virtually the complete hemisphere above the sample surface results in extended data sets where important surface-geometrical structure information is extracted and even “fingerprinting” is possible. This method is known as the very powerful angle-scanned X-ray photoelectron diffraction.

    2. Mapping ultraviolet-excited photoelectron intensities as a function of emission angles gives the possibility to do band mapping as well as to study the Fermi surface of single crystals very directly. Therefore, by switching between X-rays and ultraviolet-photons, it is possible to study the geometrical and electronic structure within the same experiment.