Faculté des sciences

X-ray photoelectron diffraction study of ultrathin PbTiO3 films

Despont, Laurent ; Lichtensteiger, Céline ; Clerc, F. ; Garnier, Michael Bernard Gunnar ; Garcia de Abajo, F.J. ; Van Hove, M. A. ; Triscone, Jean-Marc ; Aebi, Philipp

In: European Physical Journal B (The) - Condensed Matter and Complex Systems, 2006, vol. 49, no. 2, p. 141-146

Full hemispherical X-ray photoelectron diffraction (XPD) experiments have been performed to investigate at the atomic level ultrathin epitaxial c-axis oriented PbTiO3 (PTO) films grown on Nb-doped SrTiO3 substrates. Comparison between experiment and theory allows us to identify a preferential ferroelectric polarization state in a 60 Å -thick PTO film. Multiple scattering... Plus

Ajouter à la liste personnelle
    Summary
    Full hemispherical X-ray photoelectron diffraction (XPD) experiments have been performed to investigate at the atomic level ultrathin epitaxial c-axis oriented PbTiO3 (PTO) films grown on Nb-doped SrTiO3 substrates. Comparison between experiment and theory allows us to identify a preferential ferroelectric polarization state in a 60 Å -thick PTO film. Multiple scattering theory based on a cluster-model [ Phys. Rev. B 63, 075404 (2001)] is used to simulate the experiments.