Faculté des sciences

Relative detection efficiency of back- and front-illuminated charge-coupled device cameras for x-rays between 1 keV and 18 keV

Szlachetko, Jakoub ; Dousse, Jean-Claude ; Hoszowska, Joanna ; Berset, Michel ; Cao, Wei ; Szlachetko, Monika ; Kavčič, Matjaz

In: Review of Scientific Instruments, 2007, vol. 78, no. 9, p. 093102

High-resolution x-ray measurements were performed with a von Hamos-type bent crystal spectrometer using for the detection of the diffracted photons either a back-illuminated charge-coupled device (CCD) camera or a front-illuminated one. For each CCD the main x-ray emission lines (e.g., Kα, Kβ, Lα, and Lβ) of a variety of elements were measured in order to probe the... Plus

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    Summary
    High-resolution x-ray measurements were performed with a von Hamos-type bent crystal spectrometer using for the detection of the diffracted photons either a back-illuminated charge-coupled device (CCD) camera or a front-illuminated one. For each CCD the main x-ray emission lines (e.g., Kα, Kβ, Lα, and Lβ) of a variety of elements were measured in order to probe the performances of the two detectors between 1 and 18 keV. From the observed x-ray lines the linearity of the energy response, the noise level, the energy resolution, and the quantum efficiency ratio of the two CCDs were determined.