Faculté des sciences

Scanning near-field optical microscopy: transfer function and resolution limit

Blattner, P. ; Herzig, Hans-Peter ; Dändliker, René

In: Optics Communications, 1998, vol. 150, no. 4-6, p. 245-250

We present scanning near-field optical microscopy as an optical instrument characterized by a transfer function. This approach gives some theoretical guidelines for the design of near-field optical measurement systems. We emphasize that it is important to distinguish between the resolution for the optical field and the resolution for the object. In addition, to solve the general inverse... Plus

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    Summary
    We present scanning near-field optical microscopy as an optical instrument characterized by a transfer function. This approach gives some theoretical guidelines for the design of near-field optical measurement systems. We emphasize that it is important to distinguish between the resolution for the optical field and the resolution for the object. In addition, to solve the general inverse diffraction problem the measurement of phase and amplitude of the electromagnetic field is necessary.