Geometrical optics modelling of grazing incidence X-ray fluorescence of nanoscaled objects
- Nowak, Stanisław H. Physics Department, University of Fribourg, Switzerland
- Reinhardt, Falk Physikalisch-Technische Bundesanstalt (PTB), Berlin, Germany
- Beckhoff, Burkhard Physikalisch-Technische Bundesanstalt (PTB), Berlin, Germany
- Dousse, Jean-Claude Physics Department, University of Fribourg, Switzerland
- Szlachetko, Jakub Paul Scherrer Institut, Villigen PSI, Switzerland - Institute of Physics, Jan Kochanowski University, Kielce, Poland
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17.04.2013
Published in:
- Journal of Analytical Atomic Spectrometry. - 2013, vol. 28, no. 5, p. 689–696
English
X-ray Standing Wave (XSW) is a well established formalism for modelling Grazing Incidence X-ray Fluorescence (GIXRF) experiments. However, when probing nanostructured surfaces with complex morphology the effects of the interaction of the XSW with structure elements need to be investigated. This is not always easy and sometimes even not possible. In the present work a novel approach employing Geometrical Optics (GO) calculations is proposed. The model is employed for simulations of two different types of nano-particles distributed on a flat surface. It is shown that GO simulation yields results with good agreement when compared to absolute measurements even when XSW deteriorates.
- Faculty
- Faculté des sciences et de médecine
- Department
- Département de Physique
- Language
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- English
- Classification
- Physics
- License
- License undefined
- Identifiers
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- RERO DOC 32512
- DOI 10.1039/C3JA30338A
- Persistent URL
- https://folia.unifr.ch/unifr/documents/303000
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