Faculté des sciences

A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

Szlachetko, Jakoub ; Nachtegaal, M. ; Boni, E. de ; Willimann, M. ; Safonova, O. ; Sa, J. ; Smolentsev, G. ; Szlachetko, Monika ; Bokhoven, J. A. van ; Dousse, Jean-Claude ; Hoszowska, J. ; Kayser, Yves ; Jagodziński, P. ; Bergamaschi, A. ; Schmitt, Bernd ; David, Christian ; Lücke, A.

In: Review of Scientific Instruments, 2012, vol. 83, no. 10, p. 103105

We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV–9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation... Mehr

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    Summary
    We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV–9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation that allows to preserve the spectrometer resolution and spectrometer efficiency. Application of the spectrometer for time-resolved resonant inelastic x-ray scattering and single-shot x-ray emission spectroscopy is demonstrated.