A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies
- Szlachetko, Jakub Paul Scherrer Institut, Villigen PSI, Switzerland - Institute of Physics, Jan Kochanowski University, Kielce, Poland
- Nachtegaal, M. Paul Scherrer Institut, Villigen PSI, Switzerland
- Boni, E. de Paul Scherrer Institut, Villigen PSI, Switzerland
- Willimann, M. Paul Scherrer Institut, Villigen PSI, Switzerland
- Safonova, O. Paul Scherrer Institut, Villigen PSI, Switzerland
- Sa, J. Paul Scherrer Institut, Villigen PSI, Switzerland
- Smolentsev, G. Paul Scherrer Institut, Villigen PSI, Switzerland
- Szlachetko, Monika Paul Scherrer Institut, Villigen PSI, Switzerland
- Bokhoven, J. A. van Paul Scherrer Institut, Villigen PSI, Switzerland - Institute for Chemical and Bioengineering, ETH Zurich, Switzerland
- Dousse, Jean-Claude Department of Physics, University of Fribourg, Switzerland
- Hoszowska, Joanna Department of Physics, University of Fribourg, Switzerland
- Kayser, Yves Department of Physics, University of Fribourg, Switzerland
- Jagodziński, P. University of Technology, Kielce, Poland
- Bergamaschi, A. Paul Scherrer Institut, Villigen PSI, Switzerland
- Schmitt, Bernd Paul Scherrer Institut, Villigen PSI, Switzerland
- David, Christian Paul Scherrer Institut, Villigen PSI, Switzerland
- Lücke, A. Paul Scherrer Institut, Villigen PSI, Switzerland
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09.10.2012
Published in:
- Review of Scientific Instruments. - 2012, vol. 83, no. 10, p. 103105
English
We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV–9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation that allows to preserve the spectrometer resolution and spectrometer efficiency. Application of the spectrometer for time-resolved resonant inelastic x-ray scattering and single-shot x-ray emission spectroscopy is demonstrated.
- Faculty
- Faculté des sciences et de médecine
- Department
- Département de Physique
- Language
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- English
- Classification
- Physics
- License
- License undefined
- Identifiers
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- RERO DOC 30627
- DOI 10.1063/1.4756691
- Persistent URL
- https://folia.unifr.ch/unifr/documents/302755
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