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Cryo-FIB Machining: An Alternative to TEM Cryo-Sections Cut with Diamonds?

Hayles, M. ; de Winter, M. ; Schneijdenberg, C. ; Meeldijk, J. ; Persoon, H. ; Luecken, U. ; Verkleij, A. ; Humbel, B.

In: Microscopy and Microanalysis, 2011, vol. 17, no. S2, p. 644-645

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    Titre
    • Cryo-FIB Machining: An Alternative to TEM Cryo-Sections Cut with Diamonds?
    Auteur
    • Hayles, M.. FEI Company, The Netherlands
    • de Winter, M.. Utrecht University, The Netherlands
    • Schneijdenberg, C.. Utrecht University, The Netherlands
    • Meeldijk, J.. Utrecht University, The Netherlands
    • Persoon, H.. FEI Company, The Netherlands
    • Luecken, U.. FEI Company, The Netherlands
    • Verkleij, A.. Utrecht University, The Netherlands
    • Humbel, B.. Lausanne University, Switzerland
    Type de document
    • Postprint
    Langue
    • Anglais
    Publié dans
    • Microscopy and Microanalysis, 2011, vol. 17, no. S2, p. 644-645. Cambridge University Press
    Autre version électronique
    Identifiant OAI-PMH
    • oai:doc.rero.ch:298575
    Summary
    Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7-August 11, 2011