Faculté des sciences

X-ray reflectivity reveals equilibrium density profile of molecular liquid under nanometre confinement

Perret, E. ; Nygård, K. ; Satapathy, Dillip Kumar ; Balmer, T. E. ; Bunk, O. ; Heuberger, M. ; Veen, J. F. van der

In: Europhysics Letters, 2009, vol. 88, no. 3, p. 36004

A silane (tetrakis(trimethylsiloxy)silane) has been confined within a space of a few molecular diameters (9 Å) between two atomically flat opposing mica membranes. The liquid's electron density profile along the confinement direction has been determined by synchrotron X-ray reflectivity for film thicknesses of 8.58 and 11.22 nm. We find the liquid's molecules to be strongly layered at layer... Plus

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    Summary
    A silane (tetrakis(trimethylsiloxy)silane) has been confined within a space of a few molecular diameters (9 Å) between two atomically flat opposing mica membranes. The liquid's electron density profile along the confinement direction has been determined by synchrotron X-ray reflectivity for film thicknesses of 8.58 and 11.22 nm. We find the liquid's molecules to be strongly layered at layer distances significantly larger than the effective molecular diameter. The considerable free volume enables the confined liquid to retain its liquid properties.