Faculté des sciences

Layer-resolved study of Mg atom incorporation at the MgO/Ag(001) buried interface

Jaouen, Thomas ; Tricot, S. ; Delhaye, G. ; Lépine, B. ; Sébilleau, D. ; Jézéquel, G. ; Schieffer, Philippe

In: Physical Review Letters, 2013, vol. 111, no. 2, p. 027601

By combining x-ray excited Auger electron diffraction experiments and multiple scattering calculations we reveal a layer-resolved shift for the Mg KL₂₃L₂₃ Auger transition in MgO ultrathin films (4–6 Å) on Ag(001). This resolution is exploited to demonstrate the possibility of controlling Mg atom incorporation at the MgO/Ag(001) interface by exposing the MgO films to a Mg flux. A... Plus

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    Summary
    By combining x-ray excited Auger electron diffraction experiments and multiple scattering calculations we reveal a layer-resolved shift for the Mg KL₂₃L₂₃ Auger transition in MgO ultrathin films (4–6 Å) on Ag(001). This resolution is exploited to demonstrate the possibility of controlling Mg atom incorporation at the MgO/Ag(001) interface by exposing the MgO films to a Mg flux. A substantial reduction of the MgO/Ag(001) work function is observed during the exposition phase and reflects both band-offset variations at the interface and band bending effects in the oxide film.