Faculté des sciences

Optical properties of microcrystalline materials

Vaněček, Milan ; Poruba, A. ; Remeš, Z. ; Beck, N. ; Nesládek, M.

In: Journal of Non-Crystalline Solids, 1998, vol. 227-230, p. 967-972

We use optical, photocurrent and photothermal deflection spectroscopies to study defects in microcrystalline silicon (μc-Si) thin films and diamond layers. Enhanced light absorption in μc-Si films and solar cells is due to several contributions: light scattering, change in the optical transition probability for strained and surface atoms and residual amorphous fraction. Low defect... Plus

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    Summary
    We use optical, photocurrent and photothermal deflection spectroscopies to study defects in microcrystalline silicon (μc-Si) thin films and diamond layers. Enhanced light absorption in μc-Si films and solar cells is due to several contributions: light scattering, change in the optical transition probability for strained and surface atoms and residual amorphous fraction. Low defect density (optical absorption with a coefficient, α, smaller than 0.1 cm−1 at about 0.8 eV, as measured by the constant photocurrent method), amorphous volume fraction below 10% and a distinct surface texture is typical for a material yielding a good efficiency μc-Si solar cells. Main defects in heteroepitaxial chemical vapor deposition diamond films are discussed.